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Issue Date	Title Author(s) Journal	View
2014-11	Novel Gated-Multiprobe Method for Measuring a Back Electrode Effect in Amorphous Oxide-Based Thin-Film Transistors Jeong, Jaewook ; Kim, Joonwoo ; Jeong, Soon Moon IEEE Transactions on Electron Devices, v.61, no.11, pp.3757 - 3761, 2014-11	464

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